Yamaha reveals high-performance AOI option for high-density and lighting assemblies
YRi-V HS for faster high-resolution inspection adds advanced laser profiling for LED coplanarity, debuting on Yamaha’s booth 462 in Hall A3 at electronica 2024 in Munich, Germany.
Yamaha Robotics Europe has introduced the YRi-V HS optical inspection (AOI) system with enhanced features for faster performance at high resolution and greater accuracy inspecting surface-mounted LEDs.
The new YRi-V HS configuration is for electronic manufacturers in all market sectors, from consumer to industrial and automotive, seeking greater inspection resolution with high production throughput. As circuit designers increasingly adopt components with tiny feature sizes, to deliver extra functionality and comply with tough constraints on the overall form factor, manufacturers need inspection systems with greater resolution to ensure proper quality control. On the other hand, maintaining high throughput is critical to fulfil productivity targets.
The YRi-V HS now combines high inspection resolution and high throughput, to handle components such as the latest, smallest SMD chips and IC packages with fine-pitch I/Os. With its enlarged, square field of view (FOV) and 25Mpixel camera, the YRi-V HS can image a complete assembly or selected area up to 1.6 times faster than ordinary high-resolution systems.
In addition, the new YRi-V HS integrates an advanced laser system for accurate height measurement and coplanarity checking of components such as LEDs in lighting products. Laser profiling overcomes the imaging challenges presented by the LEDs’ transparent or opaque lenses, offering effective quality control for manufacturers to address LED lighting opportunities in automotive, consumer, and industrial markets. By also enabling accurate imaging of components with highly reflective surfaces, such as wafer-level chip-scale packages, laser profiling helps raise end of line yield and minimize rework.
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